ZEISS RONDCOM NEX Series

Highly Accurate for Form and Surface

RONDCOM NEX Series

Form tester with the highest accuracy in its class

The form testers of the RONDCOM NEX series enables precise measurements of roundness and roughness in the R, T and Z axes and features best-in-class rotational accuracy.

RONDCOM NEX Series

Features

RONDCOM NEX and RONDCOM NEX Rs are universal form tester for the analysis of roundness, roughness, cylinder form, perpendicularity, parallelism, straightness, flatness, coaxiality, concentricity, and thickness error. With rotational error of just 20 nanometers, both form testers are ideal for a wide range of precision parts that have a height of 300 mm or 500 mm and weigh up to 60 kg.

Perfect positioning

The patented CNC offset stylus mount enables CNC-guided rotating and pivoting of the stylus and allows deep insertion and also measurement below the R axis.

More accurate measurements

The form testers of the RONDCOM NEX Series additionally feature an on-board R axis ceramic with high rigidity and reduced weight, allowing even more accurate measurement of large cone angles, diameters and straightness.

Improved design

The form testers have an extended centering range of ± 5 mm and a precise, wear-free rotary table on air bearings. Thanks to the improved design, the form tester is even more stable against air circulation.

All advantages at a glance

  • Highest accuracy in its class with a broad spectrum of applications
  • Linear scale for exact measurements in the R axis direction
  • More accurate measurement via a CNC pivot around the measuring sphere
  • Large deflection range and high resolution of the detector and stylus system for higher throughput

Options

The SURFCOM NEX series offers wide range of solutions. In this way we provide the best solution for your application.

Technical Data for SURFCOM NEX

SURFCOM NEX 001
X/C Measuring range Z for roughness Resolution roughness Accuracy Z Straightness X
100/250 max. 1000µm min. 0.1nm +/- 2% on 20µm periode 0.05+L/1000µm
200/250 max. 1000µm min. 0.1nm +/- 2% on 20µm periode 0.05+L/1000µm
100/450 max. 1000µm min. 0.1nm +/- 2% on 20µm periode 0.05+L/1000µm
200/450 max. 1000µm min. 0.1nm +/- 2% on 20µm periode 0.05+L/1000µm
100/650 max. 1000µm min. 0.1nm +/- 2% on 20µm periode 0.05+L/1000µm
200/650 max. 1000µm min. 0.1nm +/- 2% on 20µm periode 0.05+L/1000µm

Optional: Measuring range Z for contour with standard stylus

SURFCOM NEX 030

X/C

Measuring range Z for contour

Resolution contour

Accuracy Z

Straightness X

100/250

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

200/250

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

100/450

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

200/450

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

100/650

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

200/650

60mm

0.04µm

+/-(1.5+[2H]/100)µm

1µm/100mm

Optional: Measuring range Z for roughness with standard stylus

SURFCOM NEX 040

X/C

Measuring range Z for contour

Resolution contour

Accuracy Z

Straightness X

100/250

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

200/250

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

100/450

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

200/450

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

100/650

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

200/650

60mm

0.02µm

+/-(0.8+[2H]/100)µm

1µm/100mm

Optional: Measuring range Z for roughness with standard stylus

SURFCOM NEX 031

X/C

Measuring range Z for roughness

Measuring range Z for contour

Resolution roughness

Resolution contour

Accuracy Z

Straightness X

100/250

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

200/250

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

100/450

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

200/450

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

100/650

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

200/650

max. 1000µm

60mm

min. 0.1nm

0.04µm

+/-(1.5+[2H]/100)µm

0.05+L/1000µm

SURFCOM NEX 041

X/C

Measuring range Z for roughness

Measuring range Z for contour

Resolution roughness

Resolution contour

Accuracy Z

Straightness X

100/250

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

200/250

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

100/450

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

200/450

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

100/650

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

200/650

max. 1000µm

60mm

min. 0.1nm

0.02µm

+/-(0.8+[2H]/100)µm

0.05+L/1000µm

SURFCOM NEX 100

X/C

Measuring range Z for roughness and contour

Resolution roughness and contour

Resolution only contour

Accuracy Z

Straightness X

100/250

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

200/250

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

100/450

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

200/450

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

100/650

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm

200/650

5mm

min. 0.1nm

0.1µm

+/-(1.0+[2H]/100)µm

0.05+L/1000µm