ZEISS RONDCOM NEX Series
Highly Accurate for Form and Surface
RONDCOM NEX Series
Form tester with the highest accuracy in its class
The form testers of the RONDCOM NEX series enables precise measurements of roundness and roughness in the R, T and Z axes and features best-in-class rotational accuracy.
RONDCOM NEX Series
Features
RONDCOM NEX and RONDCOM NEX Rs are universal form tester for the analysis of roundness, roughness, cylinder form, perpendicularity, parallelism, straightness, flatness, coaxiality, concentricity, and thickness error. With rotational error of just 20 nanometers, both form testers are ideal for a wide range of precision parts that have a height of 300 mm or 500 mm and weigh up to 60 kg.
Perfect positioning
The patented CNC offset stylus mount enables CNC-guided rotating and pivoting of the stylus and allows deep insertion and also measurement below the R axis.
More accurate measurements
The form testers of the RONDCOM NEX Series additionally feature an on-board R axis ceramic with high rigidity and reduced weight, allowing even more accurate measurement of large cone angles, diameters and straightness.
Improved design
The form testers have an extended centering range of ± 5 mm and a precise, wear-free rotary table on air bearings. Thanks to the improved design, the form tester is even more stable against air circulation.
All advantages at a glance
- Highest accuracy in its class with a broad spectrum of applications
- Linear scale for exact measurements in the R axis direction
- More accurate measurement via a CNC pivot around the measuring sphere
- Large deflection range and high resolution of the detector and stylus system for higher throughput
Options
The SURFCOM NEX series offers wide range of solutions. In this way we provide the best solution for your application.
Technical Data for SURFCOM NEX
SURFCOM NEX 001
X/C | Measuring range Z for roughness | Resolution roughness | Accuracy Z | Straightness X |
100/250 | max. 1000µm | min. 0.1nm | +/- 2% on 20µm periode | 0.05+L/1000µm |
200/250 | max. 1000µm | min. 0.1nm | +/- 2% on 20µm periode | 0.05+L/1000µm |
100/450 | max. 1000µm | min. 0.1nm | +/- 2% on 20µm periode | 0.05+L/1000µm |
200/450 | max. 1000µm | min. 0.1nm | +/- 2% on 20µm periode | 0.05+L/1000µm |
100/650 | max. 1000µm | min. 0.1nm | +/- 2% on 20µm periode | 0.05+L/1000µm |
200/650 | max. 1000µm | min. 0.1nm | +/- 2% on 20µm periode | 0.05+L/1000µm |
SURFCOM NEX 030
X/C |
Measuring range Z for contour |
Resolution contour |
Accuracy Z |
Straightness X |
100/250 |
60mm |
0.04µm |
+/-(1.5+[2H]/100)µm |
1µm/100mm |
200/250 |
60mm |
0.04µm |
+/-(1.5+[2H]/100)µm |
1µm/100mm |
100/450 |
60mm |
0.04µm |
+/-(1.5+[2H]/100)µm |
1µm/100mm |
200/450 |
60mm |
0.04µm |
+/-(1.5+[2H]/100)µm |
1µm/100mm |
100/650 |
60mm |
0.04µm |
+/-(1.5+[2H]/100)µm |
1µm/100mm |
200/650 |
60mm |
0.04µm |
+/-(1.5+[2H]/100)µm |
1µm/100mm |
SURFCOM NEX 040
X/C |
Measuring range Z for contour |
Resolution contour |
Accuracy Z |
Straightness X |
100/250 |
60mm |
0.02µm |
+/-(0.8+[2H]/100)µm |
1µm/100mm |
200/250 |
60mm |
0.02µm |
+/-(0.8+[2H]/100)µm |
1µm/100mm |
100/450 |
60mm |
0.02µm |
+/-(0.8+[2H]/100)µm |
1µm/100mm |
200/450 |
60mm |
0.02µm |
+/-(0.8+[2H]/100)µm |
1µm/100mm |
100/650 |
60mm |
0.02µm |
+/-(0.8+[2H]/100)µm |
1µm/100mm |
200/650 |
60mm |
0.02µm |
+/-(0.8+[2H]/100)µm |
1µm/100mm |
SURFCOM NEX 031
X/C |
Measuring range Z for roughness |
Measuring range Z for contour |
Resolution roughness |
Resolution contour |
Accuracy Z |
Straightness X |
100/250 |
max. 1000µm |
60mm |
min. 0.1nm |
0.04µm |
+/-(1.5+[2H]/100)µm |
0.05+L/1000µm |
200/250 |
max. 1000µm |
60mm |
min. 0.1nm |
0.04µm |
+/-(1.5+[2H]/100)µm |
0.05+L/1000µm |
100/450 |
max. 1000µm |
60mm |
min. 0.1nm |
0.04µm |
+/-(1.5+[2H]/100)µm |
0.05+L/1000µm |
200/450 |
max. 1000µm |
60mm |
min. 0.1nm |
0.04µm |
+/-(1.5+[2H]/100)µm |
0.05+L/1000µm |
100/650 |
max. 1000µm |
60mm |
min. 0.1nm |
0.04µm |
+/-(1.5+[2H]/100)µm |
0.05+L/1000µm |
200/650 |
max. 1000µm |
60mm |
min. 0.1nm |
0.04µm |
+/-(1.5+[2H]/100)µm |
0.05+L/1000µm |
SURFCOM NEX 041
X/C |
Measuring range Z for roughness |
Measuring range Z for contour |
Resolution roughness |
Resolution contour |
Accuracy Z |
Straightness X |
100/250 |
max. 1000µm |
60mm |
min. 0.1nm |
0.02µm |
+/-(0.8+[2H]/100)µm |
0.05+L/1000µm |
200/250 |
max. 1000µm |
60mm |
min. 0.1nm |
0.02µm |
+/-(0.8+[2H]/100)µm |
0.05+L/1000µm |
100/450 |
max. 1000µm |
60mm |
min. 0.1nm |
0.02µm |
+/-(0.8+[2H]/100)µm |
0.05+L/1000µm |
200/450 |
max. 1000µm |
60mm |
min. 0.1nm |
0.02µm |
+/-(0.8+[2H]/100)µm |
0.05+L/1000µm |
100/650 |
max. 1000µm |
60mm |
min. 0.1nm |
0.02µm |
+/-(0.8+[2H]/100)µm |
0.05+L/1000µm |
200/650 |
max. 1000µm |
60mm |
min. 0.1nm |
0.02µm |
+/-(0.8+[2H]/100)µm |
0.05+L/1000µm |
SURFCOM NEX 100
X/C |
Measuring range Z for roughness and contour |
Resolution roughness and contour |
Resolution only contour |
Accuracy Z |
Straightness X |
100/250 |
5mm |
min. 0.1nm |
0.1µm |
+/-(1.0+[2H]/100)µm |
0.05+L/1000µm |
200/250 |
5mm |
min. 0.1nm |
0.1µm |
+/-(1.0+[2H]/100)µm |
0.05+L/1000µm |
100/450 |
5mm |
min. 0.1nm |
0.1µm |
+/-(1.0+[2H]/100)µm |
0.05+L/1000µm |
200/450 |
5mm |
min. 0.1nm |
0.1µm |
+/-(1.0+[2H]/100)µm |
0.05+L/1000µm |
100/650 |
5mm |
min. 0.1nm |
0.1µm |
+/-(1.0+[2H]/100)µm |
0.05+L/1000µm |
200/650 |
5mm |
min. 0.1nm |
0.1µm |
+/-(1.0+[2H]/100)µm |
0.05+L/1000µm |